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Nikon Eclipse L300N Microscope (x 2)

Nikon Eclipse L300N Wafer Inspection microscopes incorporate Nikon’s renowned CFI60 infinity optics, offering the world’s highest level of optical performance.

The enhanced epi-fluorescencefunction, which enables 365nm UV excitation, is optimal for the inspection of semiconductor resist residues on 300mm wafers and organic electroluminescence displays.