Keithley 4200-SCS Semiconductor Characterization System (x2)

The 4200-SCS is a modular, fully integrated parameter analyzer that performs electrical characterization of materials, semiconductor devices and processes.

From basic I‑V and C‑V measurement sweeps to advanced ultra-fast pulsed I‑V, waveform capture, and transient I‑V measurements, the 4200-SCS provides the researcher or engineer with critical parameters needed for design, development or production.

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