Hitachi SU8230 Cold Field Emission Scanning Electron Microscope

The SU8230 is Hitachi’s ultra-high resolution cold-field emission scanning electron microscope. It affords a high current density to allow a greater signal to noise ratio at lower currents while maintaining a stable emission current.

It features a large range of acceleration voltages, 0.130 kV, making it suitable for a wide range of samples including non-conductive materials. The SU8230 has a multitude of detectors to allow for a combination of topographical and compositional information at a feature resolution of up to 1 nm at optimum conditions.

Attached is a 150 mm² EDX detector from Oxford Instruments which allows for a greater count rate at lower acceleration voltage and beam current intensities than most EDX detectors. Also available is a Quorum Q150T sample coater capable of sputtering chromium, for high resolution imaging, and evaporating carbon for EDX analysis.

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