Hybrid analysis of complex thin films in energy applications – a new paradigm

Event Details

Start Date
Tue, 17 Nov 2020 13:00
End Date
Tue, 17 Nov 2020 15:00
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The EU’s 2050 targets for energy efficiency and renewable energy generation stimulate fast growth of a multibillion multi-technology industry based on innovation. As a critical component of numerous technologies for energy generation, distribution and storage/​conversion, understanding thin film materials properties and how they impact on performance and reliability of energy applications is key.

The complexity of state-of-the-art thin film technologies requires challenging optimisation of multiple characteristics, which often need to be measured and somehow correlated to performance, slowing time-to-market of innovative products. Is there a better way? Can we reduce or eliminate trial-and-error approaches?

In this webinar, we will discuss the concept of hybrid metrology where data from multiple measurement methods are combined (or hybridised”) to provide reliable metrics to improve performance of thin-film based energy products. The benefits of such hybrid approach in improving the analysis of energy thin film materials will be highlighted for two case studies: photovoltaics and electrolysis.

We will talk about:

  1. Challenges and opportunities for thin films in energy applications
  2. What is hybrid metrology and how it can accelerate time-to-market?
  3. Two case studies of how hybrid metrology can improve analysis of thin film materials (for photovoltaics and electrolysis)

The webinar is part of the HyMET project, that received funding from the EMPIR programme co-financed by the Participating States and from the European Union’s Horizon 2020 research and innovation programme.For more details about the project please go to to their website — https://​www​.hymet​.ptb​.eu/​h​y​m​e​t​-​h​o​m​e​.html.

The Speakers:

Dr Fernando Castro, Head of Science (Materials) at NPL, UK. He has over a decade of experience in leading metrology development for thin film electronics and holds several prestigious international roles. He has been an invited/​keynote speaker in numerous international events in 15 countries.

Dr Roland Mainz (HZB, Germany), obtained his PhD in Physics in 2008. He has developed expertise in the areas of in-situ investigation of reactive thin film annealing by energy-dispersive X‑ray diffraction and X‑ray fluorescence. In his current position as group leader of the in-situ group at the department of Microstructure and Residual Stress Analysis at HZB he manages research and development projects in the area of thin film process analysis and development.

Dr Andreas Hertwig (BAM, Germany) more than 20 years of experience in high-tech optics optics and spectroscopy, first with ultrashort pulse laser technology and spectroscopy, since 2003 with optical surface analysis based on ellipsometry and topometry, 15 years of experience in surface and thin films analysis related to measurement problems of various industries including plasma thin-film deposition technology.

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