NanoMan V Atomic Force Microscope
NanoMan V Atomic Force Microscope. Dimension Hybrid XYZ Scanner
- X‑Y scan range: – 90μm square
- Z (vertical) range: – Imaging Mode: nominal 8μm, ±6% or better
Force Curve: nominal 7μm, ±6% or better
- Vertical noise floor: – <0.05nm RMS (in appropriate environment)
- Integral nonlinearity (X‑Y): – <1% typical
- Integral nonlinearity (Z): – <1% typical
- X‑Y noise level: – Closed-loop feedback activate: <1.8nm RMS
- X‑Y Sensor noise level: – Open-loop: <1.2nm Adev (Ra)
- Z Sensor noise level: – Force Curve bandwidths 0.1nm RMA (0.1 Hz – 5KHz)
Typical Imaging bandwidths 0.06nm RMS
Sample size/holders: – 150mm vacuum chuck for samples ≤150mm diameter, ≤12mm thick
- Enhanced Motorized
Positioning Stage: – Inspectable area 125mm x 100mm; – Resolution 2μm – Repeatability unidirectional 3μm typical, 10μm max. – Repeatability bi-directional 4μm for x‑axis, 6μm for y‑axis typical
- Optical Microscope: – 150μm to 675μm horizontal viewing area
- Motorized zoom and focus
- Resolution 1.5μm
Computer-controlled illumination
- Tip Viewing: – Scanning cantilever and sample can be viewed on axis in real time via microscope optics
- Vibration Isolation: – Silicone vibration pad provided
- Integrated vibration isolation table and acoustic enclosure provided
